ISBN: 9985590813A method is presented for compressing decision diagrams (DD) created for multi-process VHDL descriptions with the goal of functional test generation. Each process is represented either by one DD or a set of DDs. The fine-grained timing model is replaced by a coarse timing model which helps to reduce the complexity of test generation. A set of rules for compressing the DD model is given. The method is illustrated by example. Experimental data to prove the efficiency of test generation based on compressed DDs is presented
AbstractThis paper proposes an extension to the D-algorithm, for integrated circuits described using...
This paper describes, with examples, the use of advanced VHDL constructs that greatly enhance modeli...
This paper proposes minimization algorithms for the memory size and the average path length (APL) of...
A method is presented for creating decision diagrams (DD) from multi-process VHDL descriptions for t...
International audienceDecision diagrams (DD) present a suitable way for the digital system represent...
講演日: 平成20年7月28日講演場所: 情報科学研究科大講義室The talk provides for an introduction to the problem of digital syst...
The paper introduces a new type of compression for de-cision diagram data structures, such as BDDs, ...
In this paper we introduce the decomposition of Timed Decision Tables (TDT), a tabular model of syst...
To cope with the complexity of today’s digital systems in diagnostic modelling, hierarchical approac...
A novel approach to testing sequential circuits that uses multi-level decision diagram representatio...
The objective of this work is to develop an original validation approach for complex digital systems...
A unified approach is presented for calculation multi-level testability measures and for testability...
Decision diagrams are fundamental data structures that revolutionized fields such as model checking,...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?tp=&arnumber=410674&isnumber=9191Internatio...
AbstractThis paper proposes an extension to the D-algorithm, for integrated circuits described using...
This paper describes, with examples, the use of advanced VHDL constructs that greatly enhance modeli...
This paper proposes minimization algorithms for the memory size and the average path length (APL) of...
A method is presented for creating decision diagrams (DD) from multi-process VHDL descriptions for t...
International audienceDecision diagrams (DD) present a suitable way for the digital system represent...
講演日: 平成20年7月28日講演場所: 情報科学研究科大講義室The talk provides for an introduction to the problem of digital syst...
The paper introduces a new type of compression for de-cision diagram data structures, such as BDDs, ...
In this paper we introduce the decomposition of Timed Decision Tables (TDT), a tabular model of syst...
To cope with the complexity of today’s digital systems in diagnostic modelling, hierarchical approac...
A novel approach to testing sequential circuits that uses multi-level decision diagram representatio...
The objective of this work is to develop an original validation approach for complex digital systems...
A unified approach is presented for calculation multi-level testability measures and for testability...
Decision diagrams are fundamental data structures that revolutionized fields such as model checking,...
ISBN 2-913329-52-7The growing complexity of electronic systems stimulated by IC's technology progres...
website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?tp=&arnumber=410674&isnumber=9191Internatio...
AbstractThis paper proposes an extension to the D-algorithm, for integrated circuits described using...
This paper describes, with examples, the use of advanced VHDL constructs that greatly enhance modeli...
This paper proposes minimization algorithms for the memory size and the average path length (APL) of...