Soft Error Detection and Correction Technique for Radiation Hardening Based on C-element and BICS

International audience-Higher density of integration and lower power technologies are becoming more sensitive to soft errors caused by radiations. Not only memories and latches are being affected but also combinatorial circuits. Hardening by design techniques based on increasing the amount of charge representing the bit and redundancy techniques have been used over the years. But what happens if the hardening is affected? Who guards the guardians? This work proposes a system that acts as an SET filter and as a check point with self healing properties to prevent SET propagation. Index Terms-Cosmic rays, Soft Error, SET, SEU, Critical Charge, Temporal Filtering, C-element, BICS current sensor