A new double sampling X control chart for monitoring an abrupt change in the process location

This paper develops a new double sampling (DS) monitoring scheme, namely, the side-sensitive DS X chart, to monitor the process mean. The operational procedure is presented first followed by the exact form of the probability of the in-control process under the normality assumption. Finally, the performance of the new scheme is investigated by minimizing the out-of-control average run-length and extra quadratic loss function. It was observed that the proposed chart presents a better overall performance than the existing DS X chart. An illustrative example is given to facilitate the design and implementation of the new chart.Marien Graham’s research was funded by the National Research Foundation (NRF) [reference: PR_IFR190111407337, UID: 114814].https://www.tandfonline.com/loi/lssp202020-04-13hj2019Science, Mathematics and Technology Educatio