International audienceMicroprocessor design deals with many types of specifications : from functional models (SystemC or proprietary languages) to hardware description languages such as VHDL or Verilog. Functional descriptions are key to the development of new processors or System On Chips at STMicroelectronics. In order to reduce validation effort and meet aggressive time to market requirements, it is essential to discover all potential defects as early as possible in the functional model, which is at the center of the design methodology. In this paper we address the problem of automatic generation of high quality testsuites for microprocessor functional models.We introduce an overview of a software tool based on constraint solving techniq...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
Abstract- As the complexity of high-performance microprocessor increases, functional verification be...
ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed....
International audienceMicroprocessor design deals with many types of specifications : from functiona...
Abstract. Microprocessor design deals with many types of specifications: from functional models (Sys...
International audienceMicroprocessor design deals with many types of specifications: from functional...
Abstract. Microprocessor design deals with many types of specifica-tions: from functional models (Sy...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
The widespread use of hardware/software systems in cost-critical and life-critical applications moti...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
This paper addresses the problem of test vectors generation starting from an high level description ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
Abstract- As the complexity of high-performance microprocessor increases, functional verification be...
ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed....
International audienceMicroprocessor design deals with many types of specifications : from functiona...
Abstract. Microprocessor design deals with many types of specifications: from functional models (Sys...
International audienceMicroprocessor design deals with many types of specifications: from functional...
Abstract. Microprocessor design deals with many types of specifica-tions: from functional models (Sy...
In manufacturing testing, functional tests are known to detect unique defects that structural tests ...
The widespread use of hardware/software systems in cost-critical and life-critical applications moti...
Functional design verification is one of the most serious bottlenecks in modem microprocessor design...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
This paper addresses the problem of test vectors generation starting from an high level description ...
ISBN: 0444860983The problem met when testing microprocessors (unknown equivalent logical schematics ...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
Abstract — Design complexity of todays microprocessors is in-creasing at an alarming rate to cope up...
Abstract- As the complexity of high-performance microprocessor increases, functional verification be...
ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed....