Transition from radiative to nonradiative recombination in 1.3-μm and 1.5-μm InGaAs(P) multiple quantum well semiconductor diode lasers

Measurements of the threshold current, Ith as a function of temperature, T were performed on 1.3 μm and 1.5 μm compressively strained lasers from 90 K to 370 K and the temperature sensitivity parameter, To. In addition, L, the integrated spontaneous emission emanating from the side of the devices was collected. By measuring L at the threshold as a function of temperature, it was verified that the relationship To(IRad)= T holds true even to above room temperature