Alpha radiation induced space charge stability effects in semi-insulating silicon carbide semiconductors compared to diamond.

Although the use of semi-insulating silicon carbide material for radiation detection purposes has been previously demonstrated, its use in practical applications has been inhibited by space charge stability issues caused by defect concentrations within the material, the so called polarisation effect, by which the count rate and resultant spectrum changes with irradiation time. This is a result of the charge carriers generated during irradiation filling deep level defects within the material, causing space charge buildup and de-activating that trap level until the trapped charge is re-emitted. Consequently, the time dependence of the polarisation effect has been determined by a combination of parameters that can be influenced during operation, namely the incident radiation intensity, ambient light, temperature and bias. The material properties have also been considered through the use of materials with different defect capture cross sections, concentrations and energy level. A thorough characterisation of the alpha irradiation induced polarisation phenomenon in semi-insulating silicon carbide has been conducted to demonstrate that stable operation detectors are in fact possible with this material. The effects were compared to single crystal diamond and polycrystalline diamond, which are known to exhibit similar polarisation issues. The polarisation rate as an effect of incident flux, bias and temperature was determined, with the depolarisation rate as a function of ambient light and bias also demonstrated. Consequently it has been shown that stable operation can be maintained for detectors made from semi-insulating SiC material of active thickness 350 μm at incident alpha radiation fluxes of ±400 V). Furthermore, polarisation can be suitably managed or reduced through the use of light illumination and elevated temperatures (373 K)