A pure sine wave is the conventional test signal used for measuring the effective number of bits (ENOB) of an analogue to digital converter (ADC) integrated circuit. Although an important figure for many applications of ADCs, ENOB has not traditionally been used to indicate the performance of audio systems. Sine wave testing of ADCs weights the result so that peak level distortion is highlighted and this is known to be less appropriate for audio. This paper demonstrates how a multi-tone test signal can be used to measure ENOB. As this test signal has a normal distribution it gives more weighting to the central region of the ADC code range and more weighting to higher order distortion. It may therefore produce an ENOB more relevant to audio
The basic assumptions of analog-to-digital converter (ADC) effective bit estimation procedures are a...
Abstract—In the conventional ADC production test method, a high-quality analogue sine wave is applie...
This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Anal...
A pure sine wave is the conventional test signal used for measuring the effective number of bits (EN...
A practical analog-to-digital converter (ADC) introduces quantization error in excess of the ideal v...
In this paper the testing of analog-to-digital converters (ADCs) by frequency-domain analysis in mul...
A new definition is proposed for the effective number of bits of an ADC. This definition removes the...
The Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an ...
Abstract – A new definition is proposed for the effective number of bits of an ADC. This definition ...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Abstract: The paper deals with methods of a sine-wave signal generation for dynamic testing high-spe...
Nowadays most measuring instruments are digital. This means that these instruments use analog to dig...
Sigma–Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Con...
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the ...
This paper presents the design of a 0.13 µµµµm CMOS SDSDSDSD Analogue-to-Digital Converter (ADC) whi...
The basic assumptions of analog-to-digital converter (ADC) effective bit estimation procedures are a...
Abstract—In the conventional ADC production test method, a high-quality analogue sine wave is applie...
This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Anal...
A pure sine wave is the conventional test signal used for measuring the effective number of bits (EN...
A practical analog-to-digital converter (ADC) introduces quantization error in excess of the ideal v...
In this paper the testing of analog-to-digital converters (ADCs) by frequency-domain analysis in mul...
A new definition is proposed for the effective number of bits of an ADC. This definition removes the...
The Multi-Tone (MT) signal with uniform amplitudes can be used for DAC testing. This paper shows an ...
Abstract – A new definition is proposed for the effective number of bits of an ADC. This definition ...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Abstract: The paper deals with methods of a sine-wave signal generation for dynamic testing high-spe...
Nowadays most measuring instruments are digital. This means that these instruments use analog to dig...
Sigma–Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Con...
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the ...
This paper presents the design of a 0.13 µµµµm CMOS SDSDSDSD Analogue-to-Digital Converter (ADC) whi...
The basic assumptions of analog-to-digital converter (ADC) effective bit estimation procedures are a...
Abstract—In the conventional ADC production test method, a high-quality analogue sine wave is applie...
This document analyses qualities of methods used for testing dynamical parameters of Digital-to-Anal...