The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is studied as a function of ion energy. An optimum energy window in the density and C–C sp 3 content at an ion energy of ∼90 eV observed in this study. It is shown that the density of the amorphous carbon films are closely related to the sp 3 content. The observation of nanocrystals embedded in the amorphous carbon matrix is reported. Most of the crystals observed by transmission electron microscopy can be indexed to graphite, but some of the crystals can be indexed to cubic diamond. The chemical composition of the crystals is analyzed using electron energy loss spectroscopy (EELS). The only discernible EELS edge is that of C at an energy of 285...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
Studied on the electronic properties of tetrahedral amorphous carbon thin films deposited by filtere...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
Tetrahedral amorphous carbon (ta-C) thin films were deposited using both the filtered cathodic vacuu...
The structural, optical, electrical and physical properties of amorphous carbon deposited from the f...
The filtered cathodic vacuum arc (FCVA) technique has proved to be a promising method for deposition...
The filtered cathodic vacuum arc (FCVA) technique has proved to be a promising method for deposition...
The effect of substrate bias on the structural, morphological, electrical and mechanical properties ...
The effect of substrate bias on the structural, morphological, electrical and mechanical properties ...
The properties of a highly sp3 bonded form of amorphous carbon denoted ta-C deposited from a filtere...
© 2022 Author(s).Amorphous materials have been used in a range of electronic and photonic applicatio...
Amorphous carbon (a-C) films grow via energetic processes such as pulsed-laser deposition (PLD). The...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
Studied on the electronic properties of tetrahedral amorphous carbon thin films deposited by filtere...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
The microstructure of filtered cathodic vacuum arc deposited tetrahedral amorphous carbon films is s...
Tetrahedral amorphous carbon (ta-C) thin films were deposited using both the filtered cathodic vacuu...
The structural, optical, electrical and physical properties of amorphous carbon deposited from the f...
The filtered cathodic vacuum arc (FCVA) technique has proved to be a promising method for deposition...
The filtered cathodic vacuum arc (FCVA) technique has proved to be a promising method for deposition...
The effect of substrate bias on the structural, morphological, electrical and mechanical properties ...
The effect of substrate bias on the structural, morphological, electrical and mechanical properties ...
The properties of a highly sp3 bonded form of amorphous carbon denoted ta-C deposited from a filtere...
© 2022 Author(s).Amorphous materials have been used in a range of electronic and photonic applicatio...
Amorphous carbon (a-C) films grow via energetic processes such as pulsed-laser deposition (PLD). The...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-li...
Studied on the electronic properties of tetrahedral amorphous carbon thin films deposited by filtere...