Neutron-induced SEU in bulk SRAMs in terrestrial environment: simulations and experiments
- Lambert, D.
- Baggio, J.
- Ferlet-Cavrois, V.
- Flament, O.
- Palau, J.-M.
- Saigné, Frédéric
- Sagnes, B.
- Carrière, T.
Publication date
January 2004
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
International audienceThis work investigates the sensitivity of bulk technologies in the terrestrial neutron environment as a function of technology scaling. Their sensitivity is analyzed with both experiments and Monte Carlo simulations. The soft error rate (SER) of future technology generations is extrapolated, analyzed and discussed on the basis of different parameters such as the interaction volume, the secondary ion species and the incident neutron energy ranges
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