International audienceTo compensate the variability effects in advanced technologies, Process, Voltage, Temperature (PVT) monitors are mandatory to use Adaptive Voltage Scaling (AVS) or Adaptive Body Biasing (ABB) techniques. This paper describes a new monitoring system, allowing failure anticipation in real-time, looking at the timing slack of a pre-defined set of observable flip-flops. This system is made of dedicated sensor structures located near monitored flip-flop, coupled with a specific timing detection window generator, embedded within the clock-tree. Validation and performances simulated in a 45 nm low power technology, demonstrate a scalable, low power and low area system, and its compatibility with a standard CAD flow. Gains bet...
The continued scaling of digital integrated circuits has led to an increasingly larger impact of pro...
Reliability, power consumption and timing performance are key concerns for today's integrated circui...
With the continued down-scaling of IC technology and increase in manufacturing process variations, i...
International audienceTo compensate the variability effects in advanced technologies, Process, Volta...
International audiencePVT information is mandatory to control specific knobs to compen-sate the vari...
International audienceTo deal with variations, statistical methodologies can be completed by monitor...
International audiencePVT monitors are mandatory to use tunable knobs designed to compensate the var...
Conference of 20th IEEE International On-Line Testing Symposium, IOLTS 2014 ; Conference Date: 7 Jul...
Abstract—In situ monitoring is an accurate way to monitor circuit delay or timing slack, but usually...
Delay-fault monitoring sensors are widely used for Dynamic Voltage and Frequency Scaling (DVFS) to c...
Slack-time reduction is a way to improve the performance of synchronous sequential circuits. In the ...
Abstract—In situ monitoring is an accurate way to monitor circuit delay or timing slack, but usually...
Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold...
Increasing performance demands in advanced technology, together with limited energy budgets, force i...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
The continued scaling of digital integrated circuits has led to an increasingly larger impact of pro...
Reliability, power consumption and timing performance are key concerns for today's integrated circui...
With the continued down-scaling of IC technology and increase in manufacturing process variations, i...
International audienceTo compensate the variability effects in advanced technologies, Process, Volta...
International audiencePVT information is mandatory to control specific knobs to compen-sate the vari...
International audienceTo deal with variations, statistical methodologies can be completed by monitor...
International audiencePVT monitors are mandatory to use tunable knobs designed to compensate the var...
Conference of 20th IEEE International On-Line Testing Symposium, IOLTS 2014 ; Conference Date: 7 Jul...
Abstract—In situ monitoring is an accurate way to monitor circuit delay or timing slack, but usually...
Delay-fault monitoring sensors are widely used for Dynamic Voltage and Frequency Scaling (DVFS) to c...
Slack-time reduction is a way to improve the performance of synchronous sequential circuits. In the ...
Abstract—In situ monitoring is an accurate way to monitor circuit delay or timing slack, but usually...
Energy per operation minimum can be reached, depending on the process node, at near- or subthreshold...
Increasing performance demands in advanced technology, together with limited energy budgets, force i...
As technology node continues to shrink to achieve higher performance at high density, it has become ...
The continued scaling of digital integrated circuits has led to an increasingly larger impact of pro...
Reliability, power consumption and timing performance are key concerns for today's integrated circui...
With the continued down-scaling of IC technology and increase in manufacturing process variations, i...