International audienceWe present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
The refractive index and the thickness of a transparent pellicle are determined when the pellicle is...
We discuss a new method to estimate the absorption coefficient, the index of refraction, and the thi...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matr...
A HeNe laser and a 45-90 degree prism with an index of refraction of 1.51 were used to study the pri...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
We present the method, analysis, and experimental results of the Brewster’s angle method commonly us...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
A method is proposed for the determination of the complex refractive index of non-metallic thin film...
Simultaneous determination of refractive index and thickness of very thin films by ellipsometr
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
Measurements of the polarization states (represented by complex numbers Xr and Xt, respectively) of ...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
The refractive index and the thickness of a transparent pellicle are determined when the pellicle is...
We discuss a new method to estimate the absorption coefficient, the index of refraction, and the thi...
International audienceWe present a method of analysis of prism-film coupler spectroscopy based on th...
We present a method of analysis of prism–film coupler spectroscopy based on the use of transfer matr...
A HeNe laser and a 45-90 degree prism with an index of refraction of 1.51 were used to study the pri...
Integrated optics are a contemporaneous reality in which thin-film technology and methods utilized i...
We present the method, analysis, and experimental results of the Brewster’s angle method commonly us...
In this paper, we report a simple method to extract thickness and refractive index of thin-film from...
A method is proposed for the determination of the complex refractive index of non-metallic thin film...
Simultaneous determination of refractive index and thickness of very thin films by ellipsometr
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
Measurements of the polarization states (represented by complex numbers Xr and Xt, respectively) of ...
A method is presented whereby the thickness and complex refractive index of a very think, partially ...
The refractive index and the thickness of a transparent pellicle are determined when the pellicle is...
We discuss a new method to estimate the absorption coefficient, the index of refraction, and the thi...
DOI
Add to ORKG