International audienceRadiation robust circuit design for harsh environments like space is a big challenge for today engineers and researchers. As circuits become more and more complex and CMOS processes get denser and smaller, their immunity towards particle strikes decreases drastically. This work has for objective to improve the SoC robustness against particle attacks targeting very advanced processes. This should be possible combining three already proven robust design techniques: Asynchronous communication, Silicon on Insulator (SOI) technologies and Spintronics (MRAM). The combination of these three techniques should give some fundamentally new architecture with higher performances than what is available today in terms of robustness b...
Afin de suivre le rythme effréné des évolutions des systèmes embarqués et des dispositifs portables,...
The reliability of electronic circuits is subject to physical damage or functional failures due to t...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
International audienceThe behaviour of Integrated Circuits (IC), in Space, the high atmosphere or ev...
A wide range of emerging applications is driving the development of wireless sensor node technology ...
Journal ArticleA wide range of emerging applications is driving the development of wireless sensor n...
The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in ...
Les travaux de cette thèse sont axés sur le durcissement à la dose cumulée des circuits analogiques ...
This paper investigates the vulnerability of several micro- and nano-electronic technologies to a mi...
The design of integrated circuits robust to harsh environments is one of the most challenging issues...
To cope with the harsh environment of space as in the satellite applications, the electronic devices...
Abstract — One of the next challenges for asynchronous com-munication architectures is reliability, ...
Emerging technology is enabling the design community to consistently expand the amount of functional...
This thesis reports an overview and the main results of the research activity carried out within th...
Aujourd'hui, il existe plusieurs façons de développer des circuits microélectroniques adaptés aux ap...
Afin de suivre le rythme effréné des évolutions des systèmes embarqués et des dispositifs portables,...
The reliability of electronic circuits is subject to physical damage or functional failures due to t...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...
International audienceThe behaviour of Integrated Circuits (IC), in Space, the high atmosphere or ev...
A wide range of emerging applications is driving the development of wireless sensor node technology ...
Journal ArticleA wide range of emerging applications is driving the development of wireless sensor n...
The reliable operation of Integrated Circuits (ICs) has become increasingly difficult to achieve in ...
Les travaux de cette thèse sont axés sur le durcissement à la dose cumulée des circuits analogiques ...
This paper investigates the vulnerability of several micro- and nano-electronic technologies to a mi...
The design of integrated circuits robust to harsh environments is one of the most challenging issues...
To cope with the harsh environment of space as in the satellite applications, the electronic devices...
Abstract — One of the next challenges for asynchronous com-munication architectures is reliability, ...
Emerging technology is enabling the design community to consistently expand the amount of functional...
This thesis reports an overview and the main results of the research activity carried out within th...
Aujourd'hui, il existe plusieurs façons de développer des circuits microélectroniques adaptés aux ap...
Afin de suivre le rythme effréné des évolutions des systèmes embarqués et des dispositifs portables,...
The reliability of electronic circuits is subject to physical damage or functional failures due to t...
Soft Error Rate (SER) estimation is an important challenge for integrated circuits because of the in...