Statistical Sensitivity Analysis Of Mosfet Integrated Circuits Using Process Database

This paper presents a systematic approach for analyzing MOSFET integrated circuit performance as functions of MOSFET channel length and channel width variations. The methodology, which involves an algorithm based on the Tellegen\u27s theorem and a database that contains the statistical information of MOSFET process parameters, is implemented in SPICE2 circuit simulator. Sensitivity simulation of a MOSFET operational amplifier Is included to illustrate the usefulness of the method. © 1989 IEEE