Microstructural Characterization Of Inhomogeneous Media

The need for microstructural characterization extends beyond defect detection and control of fabrication processes. Accurate description of the dielectric properties is required to predict the macroscopic properties of heterogeneous or composite materials and to implement materials-by-design concepts. Traditionally, light scattering has been the tool of choice because of its noninvasive character. However, many forms of condensed matter scatter light very strongly and complications due to multiple scattering seem to prevent the direct use of such investigation methods. Recent advances in the theory of multiple light scattering show that retrieval of structural information is possible in spite of an overall randomness of the scattered field. We developed the phenomenological understanding and the methodologies necessary to correlate the morphological details of the scattering centers with the measurable macroscopic properties