We report a sensitive single-beam technique for measuring both the nonlinear refractive index and nonlinear absorption coefficient for a wide variety of materials. We describe the experimental details and present a comprehensive theoretical analysis including cases where nonlinear refraction is accompanied by nonlinear absorption. In these experiments, the transmittance of a sample is measured through a finite aperture in the far field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinear refraction are easily deduced from such a transmittance curve (Z-scan). Employing this technique, a sensitivity of better than λ./300 wavefront distortion is achieved in n2 measurements of...
To measure the degenerate (single-frequency) optical nonlinearities, third-order nonlinearity measur...
A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at...
A new technique to measure the nonlinear refractive index n2 in optical fibers and semiconductor fil...
We report a sensitive single-beam technique for measuring both the nonlinear refractive index and no...
We present a sensitive single beam technique for measuring nonlinear refraction in a variety of mate...
We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that ...
We describe the application of single beam propagation methods, namely Z-scan and EZ-scan, for the d...
We measure the nonlinear refractive coefficient n2 in BaF2, LiF, MgF2, A12O2 and Diamond using the Z...
A simple, highly sensitive method is proposed for studying nonlinear refraction in materials. In a t...
We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction ...
We describe methods for measuring the nonlinear refraction of nominally transparent materials that i...
We describe methods for measuring the nonlinear refraction of nominally transparent materials that i...
A novel method for measuring the beam quality of short, powerful laser pulses is presented. The meth...
The single-wavelength Z scan technique for measuring the spectral dependencies of optical nonlineari...
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegen...
To measure the degenerate (single-frequency) optical nonlinearities, third-order nonlinearity measur...
A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at...
A new technique to measure the nonlinear refractive index n2 in optical fibers and semiconductor fil...
We report a sensitive single-beam technique for measuring both the nonlinear refractive index and no...
We present a sensitive single beam technique for measuring nonlinear refraction in a variety of mate...
We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that ...
We describe the application of single beam propagation methods, namely Z-scan and EZ-scan, for the d...
We measure the nonlinear refractive coefficient n2 in BaF2, LiF, MgF2, A12O2 and Diamond using the Z...
A simple, highly sensitive method is proposed for studying nonlinear refraction in materials. In a t...
We introduce a method for measuring the anisotropy of nonlinear absorption and nonlinear refraction ...
We describe methods for measuring the nonlinear refraction of nominally transparent materials that i...
We describe methods for measuring the nonlinear refraction of nominally transparent materials that i...
A novel method for measuring the beam quality of short, powerful laser pulses is presented. The meth...
The single-wavelength Z scan technique for measuring the spectral dependencies of optical nonlineari...
We introduce a temporal delay in one beam of the two-color Z-scan apparatus, which measures nondegen...
To measure the degenerate (single-frequency) optical nonlinearities, third-order nonlinearity measur...
A simple dual-wavelength (two-color) Z-scan geometry is demonstrated for measuring nonlinearities at...
A new technique to measure the nonlinear refractive index n2 in optical fibers and semiconductor fil...