The efficiency of plasma assisted deposition processes such as reactive ion plating, with regard to the densification of the deposited thin films, depends strongly on the arrival rate ratio of ionized species (atoms, molecules) to the total influx of vaporized coating material. While it is relatively easy to measure ion beam currents produced by an auxiliary ion beam source (for example a Kaufman gun), it is much more difficult to meausre ion currents in plasma processes. Typical probe measurements change the plasma conditions almost instantaneously. An optical fiber Faraday ring ammeter initially developed for space plasma research provides for a non-invasive measurement of ion currents present in plasma assisted deposition processes. We w...
The plasma needle is a source to create a non-thermal radiofrequency plasma at atmospheric pressure....
International audienceAn improvement to the RF-biased planar Langmuir probe technique proposed by Br...
A circular silver thin film plasma source for the direct elemental analysis of suspended particles w...
The presented work is embedded in the research network "Integrative Ion Processes for Modern Optics"...
The plasma-surface contact in low pressure rf discharges in noble and reactive gases was studied by ...
A commercial retarding field analyzer is used to measure the time-averaged ion energy distributions ...
In this paper recent results on monitoring and control of plasma ion assisted deposition (PIAD) proc...
A method for controlling ion energies on insulating surfaces using pulsed plasmas is presented. DC p...
[[abstract]]Ion bombardment on substrate plays a crucial role in most plasma processing of materials...
The application of a pulse shaped biasing method implemented to a capacitive probe is described. Thi...
Our recently reported multifunctional plasma and deposition sensor Welzel et al., Appl. Phys. Lett....
The doctoral thesis deals with an experimental study of several diagnostic techniques intended for p...
The technique of electrical probe measurements has been used as a tool for the investigation of the ...
A brief overview of non-perturbing light diagnostics is followed by recent examples of process plasm...
A new application of the sputtering rate measurement is given in this paper. In fact, by measuring t...
The plasma needle is a source to create a non-thermal radiofrequency plasma at atmospheric pressure....
International audienceAn improvement to the RF-biased planar Langmuir probe technique proposed by Br...
A circular silver thin film plasma source for the direct elemental analysis of suspended particles w...
The presented work is embedded in the research network "Integrative Ion Processes for Modern Optics"...
The plasma-surface contact in low pressure rf discharges in noble and reactive gases was studied by ...
A commercial retarding field analyzer is used to measure the time-averaged ion energy distributions ...
In this paper recent results on monitoring and control of plasma ion assisted deposition (PIAD) proc...
A method for controlling ion energies on insulating surfaces using pulsed plasmas is presented. DC p...
[[abstract]]Ion bombardment on substrate plays a crucial role in most plasma processing of materials...
The application of a pulse shaped biasing method implemented to a capacitive probe is described. Thi...
Our recently reported multifunctional plasma and deposition sensor Welzel et al., Appl. Phys. Lett....
The doctoral thesis deals with an experimental study of several diagnostic techniques intended for p...
The technique of electrical probe measurements has been used as a tool for the investigation of the ...
A brief overview of non-perturbing light diagnostics is followed by recent examples of process plasm...
A new application of the sputtering rate measurement is given in this paper. In fact, by measuring t...
The plasma needle is a source to create a non-thermal radiofrequency plasma at atmospheric pressure....
International audienceAn improvement to the RF-biased planar Langmuir probe technique proposed by Br...
A circular silver thin film plasma source for the direct elemental analysis of suspended particles w...