Near Threshold 4D Photoexcitation And Photoionization Of Xe

The angular distribution parameter β of the N5−O2, 3O2, 3 Auger lines has been measured between the 4d5/2 and the 4d3/2 thresholds of Xe using the cis technique. The radiationless decay parameter α2 for each of the Ns-O^Ojí Auger lines and the alignment parameter A20 for the intermediate ion were also determined. Comparisons with previous values of β and α2 for the N5−O2, 3O2, 3 Auger tines have been made. In addition, shakeoff to the various states of the Xe2+ 5p4 ion has been measured following 4d photoexcitation and found to be small. These results support the contention that near-zero kinetic energy electrons observed following similar photoexcitation in the rare gases result primarily from a two-step process rather than the direct process of shakeoff. © 1992 IOP Publishing Ltd