website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?tp=&arnumber=410674&isnumber=9191International audienceA new automatic test generation principle based on a formal modeling of VHDL behavioral descriptions is proposed. Using to the finite state machine representation and a formalism close to that of Petri nets, the authors define two models which represent all the concepts associated with a VHDL description. They then propose a generation principle which uses both forward and backward time processin
The objective of this work is to develop an original validation approach for complex digital systems...
ABSTRACT: Current VLSI manufacturing processes suffer from larger defective parts ratio, partly due ...
39th IEEE Annual Computer Software and Applications Conference Workshops, COMPSACW 2015; Taichung; T...
In this paper, we propose a new high-level test pattern generation technique for sequential circuits...
International audienceIn this paper, we propose a new high-level test pattern generation technique f...
This paper proposes a behavioral-level test pattern generation algorithm for behavioral VHDL descrip...
Functional testing of HDL specifications is one of the most promising approaches for the verificatio...
A new approach for sequential circuit test generation is proposed that combines software testing bas...
Abstract: In this paper, we defined a new FSM model that based on the synchronous behavior and symbo...
We present a rigorous but transparent semantic definition of VHDL'93 covering the complete sign...
technical reportAn approach for behavioral analysis and synthesis in a single framework is presented...
A new approach for sequential circuit test genera-tion is proposed that combines software testing ba...
ISBN: 0-8186-2985-1 website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?isnumber=5869&arnumber=...
website : http://msrc.wvu.edu/JMSI/vol1.htmlInternational audienceIn this paper, we present what is ...
ISBN: 0818605421A behavioral test method of programmable circuits is proposed which is based upon th...
The objective of this work is to develop an original validation approach for complex digital systems...
ABSTRACT: Current VLSI manufacturing processes suffer from larger defective parts ratio, partly due ...
39th IEEE Annual Computer Software and Applications Conference Workshops, COMPSACW 2015; Taichung; T...
In this paper, we propose a new high-level test pattern generation technique for sequential circuits...
International audienceIn this paper, we propose a new high-level test pattern generation technique f...
This paper proposes a behavioral-level test pattern generation algorithm for behavioral VHDL descrip...
Functional testing of HDL specifications is one of the most promising approaches for the verificatio...
A new approach for sequential circuit test generation is proposed that combines software testing bas...
Abstract: In this paper, we defined a new FSM model that based on the synchronous behavior and symbo...
We present a rigorous but transparent semantic definition of VHDL'93 covering the complete sign...
technical reportAn approach for behavioral analysis and synthesis in a single framework is presented...
A new approach for sequential circuit test genera-tion is proposed that combines software testing ba...
ISBN: 0-8186-2985-1 website : http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?isnumber=5869&arnumber=...
website : http://msrc.wvu.edu/JMSI/vol1.htmlInternational audienceIn this paper, we present what is ...
ISBN: 0818605421A behavioral test method of programmable circuits is proposed which is based upon th...
The objective of this work is to develop an original validation approach for complex digital systems...
ABSTRACT: Current VLSI manufacturing processes suffer from larger defective parts ratio, partly due ...
39th IEEE Annual Computer Software and Applications Conference Workshops, COMPSACW 2015; Taichung; T...