International audienceIn this paper we use spectrophotometric measurements and a Clustering Global Optimization procedure to determine the complex refractive index of SiO2 layer from 250 nm to 1250 nm. A special commercial optical module allows the reflection and transmission measurements to be made under exactly the same illumination and measurement conditions. We compare the index determination results obtained from two different single layer SiO2 samples, with high and low index glass substrates, respectively. We then determine the refractive index of SiO2 for a bi-layer design in which the first deposited layer is Ta2O5. The corresponding solutions are discussed and we show that the real part of the complex refractive index obtained for...
The reflectance spectra and refractive index of Nd:YAG laser-oxidized SiO2 layers with thicknesses f...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
In this paper we use spectrophotometric measurements and a Clustering Global Optimization procedure ...
In this paper we use spectrophotometric measurements and a Clustering Global Optimization procedure ...
The refractive index and thickness of SiO2 thin films naturally grown on Si substrates were determin...
The main goal of the work was the elaboration of the analytical functional relationship between refr...
Refractive index versus composition data are presented for three silica based binary glass systems S...
Optical parameters of a-Si:H and indium tin oxide (ITO) thin lms deposited on glass sub-strates are ...
International audienceIn the present paper we determine the optical constants and thicknesses of mul...
Zr-doped and undoped TiO2-SiO2 thin films were fabricated by using sol-gel dip coating. TiO2:SiO2:Zr...
A procedure has been developed for the accurate measurement of film and substrate optical parameter...
A procedure has been developed for the accurate measurement of film and substrate optical parameter...
We present a white-light spectral interferometric technique for measuring the thickness of SiO2 thin...
Zr-doped and undoped TiO₂-SiO₂ thin films were fabricated by using sol-gel dip coating. TiO₂:SiO₂:Zr...
The reflectance spectra and refractive index of Nd:YAG laser-oxidized SiO2 layers with thicknesses f...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
In this paper we use spectrophotometric measurements and a Clustering Global Optimization procedure ...
In this paper we use spectrophotometric measurements and a Clustering Global Optimization procedure ...
The refractive index and thickness of SiO2 thin films naturally grown on Si substrates were determin...
The main goal of the work was the elaboration of the analytical functional relationship between refr...
Refractive index versus composition data are presented for three silica based binary glass systems S...
Optical parameters of a-Si:H and indium tin oxide (ITO) thin lms deposited on glass sub-strates are ...
International audienceIn the present paper we determine the optical constants and thicknesses of mul...
Zr-doped and undoped TiO2-SiO2 thin films were fabricated by using sol-gel dip coating. TiO2:SiO2:Zr...
A procedure has been developed for the accurate measurement of film and substrate optical parameter...
A procedure has been developed for the accurate measurement of film and substrate optical parameter...
We present a white-light spectral interferometric technique for measuring the thickness of SiO2 thin...
Zr-doped and undoped TiO₂-SiO₂ thin films were fabricated by using sol-gel dip coating. TiO₂:SiO₂:Zr...
The reflectance spectra and refractive index of Nd:YAG laser-oxidized SiO2 layers with thicknesses f...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...
International audienceThis chapter deals with the use of methods for measuring the refractive index ...