The impact of process variations and wear-out mechanisms in current and next generation technology nodes is becoming relevant and cannot be compensated at the device or architectural level. Intra-die process variations raising at the core level and platform level makes parallel multicore platforms intrinsically heterogeneous, because the various cores are clocked at different operational frequencies. Power consumption becomes heterogeneous too, both considering dynamic and leakage consumption. Wear-out processes add further uncertainty over time. In this context, to fully exploit the computational capability of the platform parallelism, variability and wear-out aware task allocation strategies must be developed. In this work, we discuss tec...
Manufacturing and environmental variations cause timing errors in microelectronic processors that ar...
The recent growth in the number of precessing units in today's multicore processor architectures ena...
The continued scaling of silicon fabrication technologies has enabled the integration of dozens of p...
The impact of process variations and wear-out mechanisms in current and next generation technology n...
Workload allocation in embedded multicore platforms is an increasing challenging issue due to hetero...
Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring m...
Recent trends in process technology suggest the need to moni-tor transistor wear-out in future proce...
none6In deep submicron designs of MultiProcessor Systems-on-Chip (MPSoC) architectures, uncompensate...
Multicore platforms are characterized by increasing variability and aging effects which imply hetero...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
none6The impact of variability on sub-45nm CMOS multimedia platforms makes hard to provide applicati...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
In this paper, we propose a design paradigm for energy efficient and variation-aware operation of ne...
none6siMultimedia streaming applications running on next-generation parallel multiprocessor arrays i...
Manufacturing and environmental variations cause timing errors in microelectronic processors that ar...
The recent growth in the number of precessing units in today's multicore processor architectures ena...
The continued scaling of silicon fabrication technologies has enabled the integration of dozens of p...
The impact of process variations and wear-out mechanisms in current and next generation technology n...
Workload allocation in embedded multicore platforms is an increasing challenging issue due to hetero...
Driven by increasingly aggressive CMOS technology scaling, sub-wavelength lithography is incurring m...
Recent trends in process technology suggest the need to moni-tor transistor wear-out in future proce...
none6In deep submicron designs of MultiProcessor Systems-on-Chip (MPSoC) architectures, uncompensate...
Multicore platforms are characterized by increasing variability and aging effects which imply hetero...
Manufacturing and environmental variations cause timing errors that are typically avoided by conserv...
none6The impact of variability on sub-45nm CMOS multimedia platforms makes hard to provide applicati...
With scaling of semiconductor fabrication technologies and the push towards deep sub-micron technolo...
In this paper, we propose a design paradigm for energy efficient and variation-aware operation of ne...
none6siMultimedia streaming applications running on next-generation parallel multiprocessor arrays i...
Manufacturing and environmental variations cause timing errors in microelectronic processors that ar...
The recent growth in the number of precessing units in today's multicore processor architectures ena...
The continued scaling of silicon fabrication technologies has enabled the integration of dozens of p...