Memory Built-In Self-Repair for Nanotechnologies

Nicolaidis, M.
Achouri, M.N.
Anghel, Lorena

Open link

Publication date

January 2003

DOI

10.1109/OLT.2003.1214373

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

This paper presents memory Built-In Self-Repair approaches allowing to achieve high yield for defect densities several orders of magnitude higher than in current technologies. Such repair schemes illustrate that we could built memories in nanoelectronic technologies that are subject to very high defect densities

Extracted data

We use cookies to provide a better user experience.

Data Protection

Memory Built-In Self-Repair for Nanotechnologies

Abstract

Extracted data

Memory Built-In Self-Repair for Nanotechnologies

Abstract

Extracted data

Related items

Related items