This paper presents a study of the behavior of a built-in current sensor (BICS) to be used for online concurrent error detection in circuits working in radiation-exposed environments. BIC sensors are used to monitor the power-bus static current of these circuits to detect excessive current consumption. This excessive static current consumption is compared to a predefined reference value in order to detect radiation-induced multiple parametric failures and system power supply breakdown. BIC sensors can also be affected by these faults and the reliability of the system can be lost. However, we show that the proposed current sensor is strongly code disjoint (SCD) with respect to the above faults and the system reliability is guaranteed
The authors present a novel scheme for implementing self-checking circuits in static CMOS. A strongl...
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detect...
International audience-Higher density of integration and lower power technologies are becoming more ...
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concur...
ISBN: 0818655208We present a new technique to improve the reliability of SRAMs used in space radiati...
We propose in this paper a BICS-only method for concurrent error detection (CED) where a built-in cu...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
International audienceIn this paper we describe an approach to perform on-line detection of faults i...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
ISBN: 0769522882We propose a new built-in current sensor (BICS) to detect single event upsets (SEUs)...
International audienceSeveral architectures of Bulk Built-In Current Sensors (BBICS) were recently p...
This paper presents the challenges and solutions of applying Built-In-Current Sensors (BICS) to a sa...
International audienceBulk Built-In Current Sensors (BBICS) are fault detection mechanisms embedded ...
ISBN: 0780329929This paper presents a new technique for designing reliable multichip modules (MCMs) ...
Memories are one of the most widely used elements in electronic systems, and their reliability when ...
The authors present a novel scheme for implementing self-checking circuits in static CMOS. A strongl...
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detect...
International audience-Higher density of integration and lower power technologies are becoming more ...
A technique for concurrently checking faults in static CMOS circuits is proposed. It performs concur...
ISBN: 0818655208We present a new technique to improve the reliability of SRAMs used in space radiati...
We propose in this paper a BICS-only method for concurrent error detection (CED) where a built-in cu...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
International audienceIn this paper we describe an approach to perform on-line detection of faults i...
In this paper we propose a new Built in Current Sensor (BICS) to detect single event upsets in SRAM....
ISBN: 0769522882We propose a new built-in current sensor (BICS) to detect single event upsets (SEUs)...
International audienceSeveral architectures of Bulk Built-In Current Sensors (BBICS) were recently p...
This paper presents the challenges and solutions of applying Built-In-Current Sensors (BICS) to a sa...
International audienceBulk Built-In Current Sensors (BBICS) are fault detection mechanisms embedded ...
ISBN: 0780329929This paper presents a new technique for designing reliable multichip modules (MCMs) ...
Memories are one of the most widely used elements in electronic systems, and their reliability when ...
The authors present a novel scheme for implementing self-checking circuits in static CMOS. A strongl...
International audienceThis work presents a novel scheme of built-in current sensor (BICS) for detect...
International audience-Higher density of integration and lower power technologies are becoming more ...