On the design of self-checking boundary scannable boards

The boundary scan technique and the unified built-in self-test (BIST) scheme are combined in order to develop a strategy suitable for manufacture, field testing and concurrent error detection for integrated circuits and board interconnects. Such unification of offline and online testing plays a major role in the design for board testability of self-checking boards. This unified test strategy is primarily aimed at critical application designs: transportation systems, and nuclear plant