Evidences of SEU tolerance for digital implementations of artificial neural networks: one year MPTB flight results
- Velazco, Raoul
- Cheynet, P.
- Tissot, A.
- Haussy, J.
- Lambert, J.
- Ecoffet, R.
Publication date
January 2000
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
The Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite has been in a high radiation orbit since November 1997. This paper presents one year flight results of two of these experiments programmed to emulate an Artificial Neural Network (ANN) devoted to texture analysis. Telemetred data provide evidences of the ANN intrinsic fault tolerance properties
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