SEU induced errors observed in microprocessor systems
- Asenek, V.
- Underwood, C.
- Velazco, Raoul
- Rezgui, S.
- Oldfield, M.
- Cheynet, P.
- Ecoffet, R.
Publication date
January 1998
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
In this paper, we present software tools for predicting the rate and nature of observable SEU induced errors in microprocessor systems. These tools are built around a commercial microprocessor simulator and are used to analyse real satellite application systems. Results obtained from simulating the nature of SEU induced errors are shown to correlate with ground-based radiation test dat
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