SEU fault tolerance in artificial neural networks

Velazco, Raoul
Assoum, A.
Radi, M.E.
Ecoffet, R.
Botey, X.

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Publication date

January 1995

DOI

10.1109/23.489227

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

In this paper we investigate the robustness of Artificial Neural Networks when encountering transient modification of information bits related to the network operation. These kinds of faults are likely to occur as a consequence of interaction with radiation. Results of tests performed to evaluate the fault tolerance properties of two different digital neural circuits are presented

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SEU fault tolerance in artificial neural networks

Abstract

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SEU fault tolerance in artificial neural networks

Abstract

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