Automatic test generation for maximal diagnosis of linear analog circuits
- Courtois, B.
- Kolarik, V.
- Lubaszewski, Marcelo
- Mir, Salvador
Publication date
January 1996
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
ISBN: 0818674237A fault-based multifrequency test generation and fault diagnosis procedure is proposed in this work. The procedure selects a minimal set of test measures and generates the minimal set of frequency tests which guarantee maximum fault coverage and maximal diagnosis of circuit AC hard/soft faults. The procedure is exemplified for several self-testable linear analog circuits
Add to ORKG