Analysis of experimental results on functional testing and diagnosis of complex circuits

Bellon, C.
Velazco, Raoul
Ziade, H.

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Publication date

January 1988

DOI

10.1109/TEST.1988.207781

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

ISBN: 0818608706A number of functional-level test approaches for microprocessors have been proposed. The GAPT approach, presented here, is a pragmatic one, but it is supported by a set of tools and experimental results. The authors describe the GAPT approach in detail. They draw tentative conclusions with respect to the effectiveness and scope of these functional test generation methods

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Analysis of experimental results on functional testing and diagnosis of complex circuits

Abstract

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Analysis of experimental results on functional testing and diagnosis of complex circuits

Abstract

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