Add to ORKGISBN: 0818607262A strategy is derived for failure analysis in random logic devices such as microprocessors and other VLSI chips when the electrical scheme is not known. This strategy is based on the use of a test tool composed of a scanning electron microscope allied to voltage contrast, and exerciser, an image processing system, and a control and data processing system. The tool is described, and first results of the application of the method, based on image comparison, are shown. Directions for future research are mentioned
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
As an approach towards automated contactless IC probing we describe a laser beam test system for fai...
A data processing system, as part of a whole integrated test system for debugging VLSI circuits usin...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
The authors establish main guidelines of new methods and new tools which allows one to test for fail...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
Attention is given first to the various applications that can take advantage of e-beam testing: insp...
A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling ...
SIGLECNRS RS 17660 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
The laser scanning microscope (LSM) is a fairly new device for contactless testing. The nondestructi...
Optical beam testing methods offer several advantages with respect to conventional Scanning Electron...
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
As an approach towards automated contactless IC probing we describe a laser beam test system for fai...
A data processing system, as part of a whole integrated test system for debugging VLSI circuits usin...
Describes a new strategy for failure analysis in random logic devices such as microprocessors and ot...
A current research project at IMAG/TIM3 Laboratory aims at developing an integrated test system comb...
The authors establish main guidelines of new methods and new tools which allows one to test for fail...
A current research project at IMAG/TIM3 Laboratory aims at an integrated test system co...
Attention is given first to the various applications that can take advantage of e-beam testing: insp...
A diagnosis system devoted to precise failure analysis of complex ICs has been built up by coupling ...
SIGLECNRS RS 17660 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc
Voltage contrast is a powerful technique for the visualisation of the internal logic states of integ...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
Semiconductor device failure analysis using the scanning electron microscope (SEM) has become a stan...
The laser scanning microscope (LSM) is a fairly new device for contactless testing. The nondestructi...
Optical beam testing methods offer several advantages with respect to conventional Scanning Electron...
Charge-Induced Voltage Alteration (CIVA), Light-Induced Voltage Alteration, (LIVA), and Low Energy C...
As an approach towards automated contactless IC probing we describe a laser beam test system for fai...
A data processing system, as part of a whole integrated test system for debugging VLSI circuits usin...