Add to ORKGA methodology for on-line testing of microprocessors without using massive redundancy is developed. This methodology includes different steps in order to determine the main parameter: the distribution of the detection time. These steps involve latency times evaluation, modeling, functional testing, LSI-MOS circuits testing and optimization problems. The methodology has been entirely applied to the Motorola 6800 and numerical results for that microprocessor are given
We propose an on-line testing approach for the control logic of high performance microprocessors. Ra...
ISBN: 0818670398With the increasing need for on-line reliability today's electronic systems often re...
With the growing use of the microprocessors the problematics of testing become more and more import...
We propose a low cost and low intrusive approach to test on line the scheduler of high performance m...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
We propose a low cost and low intrusive approach to test on line the scheduler of high performance m...
This paper continues to discuss the problem of functional testing of embedded microprocessors, start...
ISBN: 0818605421A behavioral test method of programmable circuits is proposed which is based upon th...
Abstract-In this paper, we present a method of testing digital cir-cuits during normal operation. Th...
This paper presents an overview of a comprehensive collection of on-line testing techniques for VLSI...
The paper describes the strategy adopted to implement on-line test procedures for a commercial micro...
We propose an on-line testing approach for the control logic of high performance microprocessors. Ra...
ISBN: 0818670398With the increasing need for on-line reliability today's electronic systems often re...
With the growing use of the microprocessors the problematics of testing become more and more import...
We propose a low cost and low intrusive approach to test on line the scheduler of high performance m...
The gate-level testing also called low-level testing is generally appropriate at the design time and...
ISBN: 0852962894A test method based upon the external description of microprocessors is proposed. Th...
The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. ...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
The problems met when testing microprocessors (unknown equivalent logical schematics and fault hypot...
We propose a low cost and low intrusive approach to test on line the scheduler of high performance m...
This paper continues to discuss the problem of functional testing of embedded microprocessors, start...
ISBN: 0818605421A behavioral test method of programmable circuits is proposed which is based upon th...
Abstract-In this paper, we present a method of testing digital cir-cuits during normal operation. Th...
This paper presents an overview of a comprehensive collection of on-line testing techniques for VLSI...
The paper describes the strategy adopted to implement on-line test procedures for a commercial micro...
We propose an on-line testing approach for the control logic of high performance microprocessors. Ra...
ISBN: 0818670398With the increasing need for on-line reliability today's electronic systems often re...
With the growing use of the microprocessors the problematics of testing become more and more import...