Transparent BIST for RAMs

ISBN: 0780307607A technique allowing the transformation of any RAM test algorithm to a transparent built-in self-test (BIST) algorithm is described. At the end of the test session the contents of the RAM are equal to its initial contents. Thus, the transparent BIST is suitable for periodic testing. The transparent BIST algorithm does not decrease the fault coverage of the initial algorithms and involves a slightly greater area than the standard BIST. The transparent BIST can be used for both fabrication testing and periodic testing