A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is presented. The fault and error models of a large class of VLSI ALU designs are discussed. The proposed design is proved to be fault-secure and self-testing with respect to any single fault in the ALU part. The proposed BCP ALU is proved to be SFS with any design of BCP circuit. Consequently, a self-checking processor whose data path is encoded entirely in a Berger code can be achieved. An efficient self-checking processor can then be designed
General rules given for the design of self-checking circuits with respect to realistic fault hypothe...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
ISBN 2-913329-70-5With the increasing integration density, new generations of integrated circuits ar...
A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is pre...
ISBN: 0818636807The author presents efficient self-checking implementations for adders and ALUs (rip...
A novel approach to designing concurrent-error-detecting arithmetic and logic units using Berger cod...
ISBN: 0818607033The necessity to consider fault models representing real faults occurring in integra...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
Abstract: In recent years the complexity of digital systems has increased dramatically. Although sem...
145 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1982.This research has mainly cent...
Encoding techniques and dedicated self-checking architectures cart be conveniently adopted in VLSI d...
In this paper, we propose an approach to detect the temporary faults induced by an environmental phe...
In this paper, we propose an approach to detect the temporary faults induced by an environmental phe...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
With continued scaling of silicon process technology, producing reliable electronic components in ex...
General rules given for the design of self-checking circuits with respect to realistic fault hypothe...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
ISBN 2-913329-70-5With the increasing integration density, new generations of integrated circuits ar...
A strongly fault secure (SFS) ALU design based on the Berger check prediction (BCP) technique is pre...
ISBN: 0818636807The author presents efficient self-checking implementations for adders and ALUs (rip...
A novel approach to designing concurrent-error-detecting arithmetic and logic units using Berger cod...
ISBN: 0818607033The necessity to consider fault models representing real faults occurring in integra...
Abstract-Self-checking circuits can detect the presence of both transient and permanent faults. A se...
Abstract: In recent years the complexity of digital systems has increased dramatically. Although sem...
145 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1982.This research has mainly cent...
Encoding techniques and dedicated self-checking architectures cart be conveniently adopted in VLSI d...
In this paper, we propose an approach to detect the temporary faults induced by an environmental phe...
In this paper, we propose an approach to detect the temporary faults induced by an environmental phe...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
With continued scaling of silicon process technology, producing reliable electronic components in ex...
General rules given for the design of self-checking circuits with respect to realistic fault hypothe...
In this paper we analyze the probability that transient faults, multiple or single, affecting a chec...
ISBN 2-913329-70-5With the increasing integration density, new generations of integrated circuits ar...