Taking advantage of ASICs to improve dependability with very low overheads [PLC]
- Michel, T.
- Leveugle, R.
- Saucier, G.
- Doucet, R.
- Chapier, P.
Publication date
January 1994
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
ISBN: 0818654104On-line test mechanisms have been designed for the CPU of a programmable logic controller. Specific devices integrated in an ASIC processor perform control flow checking during both application and system program executions. A prototype has been implemented, demonstrating the very low overhead of the approach. Results of fault injections have then proved the dependability increase at system level
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