Proceedings of 6th IEEE InternationalOn-Line Testing Workshop (IOLT 2000), July 3-5, 2000 Palma De Mallorca, Spain

ISBN: 0-7695-0646-1The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. These needs will increase dramatically in the near future, since very deep submicron and nanometer technologies will impact adversely noise margins and make mandatory integrating on-line test in all ICs. The workshop is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication