10th IEEE International On-Line Testing Symposium (IOLT 2004), Madeira Island, Portugal, July 12-14, 2004

ISBN: 0-7695-2180-0Issues related to on-line testing are increasingly important in modern electronics systems In particular, the huge complexity of electronic systems has seen reliability needs growing up in various application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies. These technologies impact adversely noise margins and make mandatory integrating on-line test in modern ICs. The Symposium is also emphasizing on on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in cryptographic chips