Proceedings on 3th IEEE International On-Line Testing Workshop (IOLT'97), July 7-9, 1997, Crete, Greece

Nicolaidis, M.
Nikolos, D.
Paschalis, A.

Publication date

January 1997

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost effective on-line test techniques. This workshop provides an informal forum to discuss all aspects of on-line testing

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Proceedings on 3th IEEE International On-Line Testing Workshop (IOLT'97), July 7-9, 1997, Crete, Greece

Abstract

Extracted data

Proceedings on 3th IEEE International On-Line Testing Workshop (IOLT'97), July 7-9, 1997, Crete, Greece

Abstract

Extracted data

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