Proceedings on 2nd International On-Line Testing Workshop (IOLT'96), July 8-10, 1996, Biarritz - Saint-Jean-de-Luz, France

The increased complexity of electronic systems has seen increasing reliability needs in various application domains as well as pressure for low cost products. There is a corresponding increased demand for cost-effective on-line test techniques. This workshop provides an informal forum to discuss all aspects of on-line testing