Single-event-upset-like fault injection: a comprehensive framework

Faure, F.
Velazco, Raoul
Peronnard, P.

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Publication date

January 2005

DOI

10.1109/TNS.2005.860689

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Abstract

INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0018-9499International audienceAn approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this paper. Resulting cross-sections fit very well with measured ones

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Single-event-upset-like fault injection: a comprehensive framework

Abstract

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Single-event-upset-like fault injection: a comprehensive framework

Abstract

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