International audienceThis paper presents the development of a set of tools and the associated methodology for performing pulsed laser fault injection experiments in SRAM-based FPGAs. The new platform allows reliable evaluation of the impact of SEU and MBU in the configuration memory
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
This paper is aimed at emulating the errors in semiconductor memories by space radiation with a puls...
International audienceSRAM-based FPGAs are very sensitive to harsh conditions, like radiations or io...
International audienceThis paper presents principles and results of dynamic testing of an SRAM-based...
ISBN : 978-2-84813-139-9This work aims at designing a test methodology to analyze the effect of natu...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
International audienceI. IntroductionLaser fault injection – mechanism SRAM fault injection sensitiv...
This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
International audienceThis paper presents the design of an SRAM cell with a robustness improvement a...
Commercial-Off-The-Shelf SRAM-based FPGA devices are becoming of interests for applications where hi...
This paper analyses the effects of Single Event Upsets in an SRAM-based FPGA, with special emphasis ...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
Cette thèse s'intéresse en premier lieu à l'évaluation des effets fonctionnels des erreurs survenant...
International audienceThis paper presents a new and highly efficient approach for the estimation by ...
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
This paper is aimed at emulating the errors in semiconductor memories by space radiation with a puls...
International audienceSRAM-based FPGAs are very sensitive to harsh conditions, like radiations or io...
International audienceThis paper presents principles and results of dynamic testing of an SRAM-based...
ISBN : 978-2-84813-139-9This work aims at designing a test methodology to analyze the effect of natu...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
International audienceI. IntroductionLaser fault injection – mechanism SRAM fault injection sensitiv...
This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
International audienceThis paper presents the design of an SRAM cell with a robustness improvement a...
Commercial-Off-The-Shelf SRAM-based FPGA devices are becoming of interests for applications where hi...
This paper analyses the effects of Single Event Upsets in an SRAM-based FPGA, with special emphasis ...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
Cette thèse s'intéresse en premier lieu à l'évaluation des effets fonctionnels des erreurs survenant...
International audienceThis paper presents a new and highly efficient approach for the estimation by ...
SRAM based reprogrammable FPGAs are sensitive to radiation-induced Single Event Upsets (SEU), not on...
This paper is aimed at emulating the errors in semiconductor memories by space radiation with a puls...
International audienceSRAM-based FPGAs are very sensitive to harsh conditions, like radiations or io...
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