The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy from the control point of view. This analysis allows us to propose improvements for the Atomic Force Microscopes standard functions. Control approach plays an important role in all this development but profound understanding of the instruments physics has to be reached as well.The second chapter briefly but completely overviews the most important techniques to operate the Scanning Probe Microscope and more precisely the AFM. This chapter should unveil advantages and difficulties of the existing techniques. The most basic function parts of AFM are presented. Followed by a summary of Contact (static) operation mode and Non-contact (dynamic) ope...
One of the main research topic of our department is the advanced control strategies. The real-time s...
This research is focused on improving the mechatronic design and control strategies of Atomic Force ...
The Atomic Force Microscope (AFM) has demonstrated its usefulness on a nanometer scale surpassing th...
The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy ...
The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy ...
This paper offers a concise survey of the most commonly used feedback loops for atomic force microsc...
Abstract — The Atomic Force Microscope (AFM) is one of the most versatile tools in nanotechnology. F...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
The quality of atomic force microscope (AFM) data strongly depends on scan and controller parameters...
Atomic force microscopes or AFMs are instruments which use a mechanical probe to scan a sample and e...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2003.Includes...
International audienceA control strategy is here investigated in order to improve the measurement pe...
Research Doctorate - Doctor of Philosophy (PhD)The Atomic Force Microscope (AFM) is a mechanical mic...
Research Doctorate - Doctor of Philosophy (PhD)The atomic force microscope is possibly one of the gr...
One of the main research topic of our department is the advanced control strategies. The real-time s...
This research is focused on improving the mechatronic design and control strategies of Atomic Force ...
The Atomic Force Microscope (AFM) has demonstrated its usefulness on a nanometer scale surpassing th...
The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy ...
The presented work concentrates on a complete and deep understanding of the Atomic Force Microscopy ...
This paper offers a concise survey of the most commonly used feedback loops for atomic force microsc...
Abstract — The Atomic Force Microscope (AFM) is one of the most versatile tools in nanotechnology. F...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
The quality of atomic force microscope (AFM) data strongly depends on scan and controller parameters...
Atomic force microscopes or AFMs are instruments which use a mechanical probe to scan a sample and e...
An Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized fle...
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2003.Includes...
International audienceA control strategy is here investigated in order to improve the measurement pe...
Research Doctorate - Doctor of Philosophy (PhD)The Atomic Force Microscope (AFM) is a mechanical mic...
Research Doctorate - Doctor of Philosophy (PhD)The atomic force microscope is possibly one of the gr...
One of the main research topic of our department is the advanced control strategies. The real-time s...
This research is focused on improving the mechatronic design and control strategies of Atomic Force ...
The Atomic Force Microscope (AFM) has demonstrated its usefulness on a nanometer scale surpassing th...