Predicting the SEU Error Rate through Fault Injection for a Complex Microprocessor
- Peronnard, P.
- Ecoffet, R.
- Pignol, M.
- Bellin, D.
- Velazco, Raoul
- Foucard, G.
Publication date
June 2008
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate for an application running on a complex processor. Both, radiation ground testing and fault injection, were performed while the selected processor, a Power PC 7448, executed a software issued from a real space application. The predicted error rate shows that generally used strategies, based on static cross-section, significantly overestimate the application error rate
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