International audienceEvaluating the robustness of digital circuits with respect to soft errors has become an important part of the design flow for many applications. The identification and hardening of the most critical registers is often necessary, while limiting the induced overheads. At the same time, the complexity of the circuits and the time to market pressure continue increasing. In this context, we briefly review the evolution of the techniques allowing a designer to evaluate the robustness early in the design flow and to identify the most critical elements. We discuss some limitations, then we propose new approaches to improve this process and we show some preliminary results
It is generally expected that nanoelectronic circuits will have to be protected against soft errors ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
are major concerns because digital circuits are more susceptible to external noise sources. Soft Err...
Abstract—Evaluating the robustness of digital circuits with respect to soft errors has become an imp...
International audienceEvaluating the robustness of digital circuits with respect to soft errors has ...
The risks of soft errors increase with system complexity, reduction in operational voltages, exponen...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
ISBN: 0780350936Error detecting and correcting code based memory design, self-checking design, VLSI-...
Abstract—Due to current technology scaling trends such as shrinking feature sizes and decreasing sup...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Minimizing the risk of system failure in any computer structure requires identifying those component...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
It is generally expected that nanoelectronic circuits will have to be protected against soft errors ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
are major concerns because digital circuits are more susceptible to external noise sources. Soft Err...
Abstract—Evaluating the robustness of digital circuits with respect to soft errors has become an imp...
International audienceEvaluating the robustness of digital circuits with respect to soft errors has ...
The risks of soft errors increase with system complexity, reduction in operational voltages, exponen...
In the last decade, the focus of fault-tolerance methods has tended towards circuit level modificati...
ISBN: 0780350936Error detecting and correcting code based memory design, self-checking design, VLSI-...
Abstract—Due to current technology scaling trends such as shrinking feature sizes and decreasing sup...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Minimizing the risk of system failure in any computer structure requires identifying those component...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced tra...
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in d...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
It is generally expected that nanoelectronic circuits will have to be protected against soft errors ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
are major concerns because digital circuits are more susceptible to external noise sources. Soft Err...