International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obtained with particle accelerators, but they are far larger than real application failure rates that depend on the dynamic application behavior and on the cache protection mechanisms. In this paper, we propose a new methodology to evaluate the real cache sensitivity for a given application, and to calculate a more accurate failure rate. This methodology is based on the monitoring of cache accesses, and requires a microprocessor simulator. It is applied in this paper to the LEON3 soft-core with several benchmarks. Results are validated by fault injections on one implementation of the processor running the same programs: the proposed tool predicte...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceIn this paper, we explain the validation of the Cache Analyzer prediction tech...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceIn this paper, we explain the validation of the Cache Analyzer prediction tech...
Low voltage operation and small device sizes reduce the critical charge stored in a SRAM cell making...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
Cosmic-ray induced soft errors in cache memories are becoming a major threat to the reliability of m...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
International audienceThis paper presents two error models to evaluate safety of a software error de...
Technology scaling leads to burn-in phase out and increasing post-silicon test complexity, which inc...
A mathematical model is described to predict microprocessor fault tolerance under radiation. The mod...