International audienceThis work takes place within the IMPROVE European project aimed at increasing the availability of manufacturing equipment and to avoid rejection of the products in the semiconductor field. The thermal furnaces are one of the important production equipment. They are composed of two processing reactors for the gas deposition on silicon wafers at low pressure and high temperature. Due to the occurrence and the severity of registered drifts, this equipment requires special attention. In this context, we propose a probabilistic model to predict failures based on Bayesian belief networks. The sequential data are strongly present on the extracted databases and their modeling is important. For their simplicity and flexibility,...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
Today, the semiconductor industry must be able to produce Integrated Circuit (IC) withreduced cycle ...
International audienceThis paper presents a procedure for failure prognostic by using Dynamic Bayesi...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produ...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceThe evolution of microelectronics is characterized by an intense competitive e...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
This paper presents a comparison of three algorithm types (Bayesian Networks, Random Forest and Line...
In this paper, a model for failure analysis using the theory of Bayesian Belief Networks (BBN), will...
International audienceThe production of microelectronic components is characterized by an important ...
Dynamic Bayesian networks (DBNs) represent complex time-dependent causal relationships through the u...
In this paper a generic degradation model based on Dynamic Bayesian Networks (DBN) which predicts th...
As the instrumentation and control (I&C) systems in nuclear power plants (NPPs) have been replac...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
Today, the semiconductor industry must be able to produce Integrated Circuit (IC) withreduced cycle ...
International audienceThis paper presents a procedure for failure prognostic by using Dynamic Bayesi...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produ...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceThe evolution of microelectronics is characterized by an intense competitive e...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
This paper presents a comparison of three algorithm types (Bayesian Networks, Random Forest and Line...
In this paper, a model for failure analysis using the theory of Bayesian Belief Networks (BBN), will...
International audienceThe production of microelectronic components is characterized by an important ...
Dynamic Bayesian networks (DBNs) represent complex time-dependent causal relationships through the u...
In this paper a generic degradation model based on Dynamic Bayesian Networks (DBN) which predicts th...
As the instrumentation and control (I&C) systems in nuclear power plants (NPPs) have been replac...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
Today, the semiconductor industry must be able to produce Integrated Circuit (IC) withreduced cycle ...
International audienceThis paper presents a procedure for failure prognostic by using Dynamic Bayesi...