Add to ORKGInternational audienceA new fully automated SEU fault-injection method is explored. Error rates issued from its application to an 8051 microcontroller were in good agreement with radiation ground testing putting in evidence the accuracy of the studied
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed ...
International audienceEvaluating the sensitivity to soft-errors of integrated circuits and systems b...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0018-9499International audienceAn ...
The effects of transient bit flips on the operation of processor based architectures is investigated...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
Fault injection through partial dynamic reconfiguration can simulate upsets in configuration memory ...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to l...
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed ...
International audienceEvaluating the sensitivity to soft-errors of integrated circuits and systems b...
ISBN : 978-1-4244-1665-3International audienceThis paper deals with the prediction of SEU error rate...
International audienceSingle Event Upset (SEU) phenomena is becoming a major concern in applications...
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0018-9499International audienceAn ...
The effects of transient bit flips on the operation of processor based architectures is investigated...
In this paper, we present software tools for predicting the rate and nature of observable SEU induce...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
Fault injection through partial dynamic reconfiguration can simulate upsets in configuration memory ...
International audienceThis paper presents a new fault injection method based on the CEU (Code Emulat...
In this paper are first summarized representative examples of anomalies observed in systems operatin...
In order to increase the robustness of a circuit against SEUs, fault injection is commonly used to l...
International audienceIn this paper is described a purely software technique allowing to detect SEUs...
ISBN 978-1-4673-2355-0International audienceAn approach to study the effects of soft errors by fault...
Abstract—An approach to study the effects of single event upsets (SEU) by fault injection performed ...