International audienceThis paper proposes an estimation method for the confidence level of feedback information (CLFI), namely the confidence level of reported information in computer integrated manufacturing (CIM) architecture for logic diagnosis. We studied the factors affecting CLFI, such as the measurement system reliability, production context, position of sensors in the acquisition chains, type of products, reference metrology, preventive maintenance and corrective maintenance based on historical data and feedback information generated by production equipments. We introduced the new 'CLFI' concept based on the Dynamic Bayesian Network(DBN) approach, Naïve Bayes model and Tree Augmented Naïve Bayes model. Our contribution includes an o...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...
International audienceThis work takes place within the IMPROVE European project aimed at increasing ...
Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produ...
International audienceThis paper proposes an estimation method for the confidence level of feedback ...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Abstract: Nowadays, the complex manufacturing processes have to be dynamically modelled and controll...
This paper provides a methodology to determine the reliability of a system, when only limited inform...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
Functional verification is generally regarded as the most critical phase in the successful developme...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
Any conclusion about a system’s hidden behaviour based on the observation of findings emanating from...
International audienceThis paper presents the CBNB (Causal Bayesian Networks Building) algorithm for...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...
International audienceThis work takes place within the IMPROVE European project aimed at increasing ...
Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produ...
International audienceThis paper proposes an estimation method for the confidence level of feedback ...
International audienceNowadays, Semiconductor Manufacturing is operating in an intense competitive e...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
Abstract: Nowadays, the complex manufacturing processes have to be dynamically modelled and controll...
This paper provides a methodology to determine the reliability of a system, when only limited inform...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
Functional verification is generally regarded as the most critical phase in the successful developme...
This paper develops a generic degradation model based on Dynamic Bayesian Networks (DBN) which predi...
The Semiconductor Industry (SI) is facing the challenge of high-mix low-volume production due to inc...
Any conclusion about a system’s hidden behaviour based on the observation of findings emanating from...
International audienceThis paper presents the CBNB (Causal Bayesian Networks Building) algorithm for...
Since the availability of components, systems and subsystems in an assembly line is an indicator of ...
International audienceThis work takes place within the IMPROVE European project aimed at increasing ...
Pour maintenir leur compétitivité, les industries du semi-conducteur doivent être en mesure de produ...