International audienceThis paper proposes a test protocol for drift identification and classification in a complex production system. The key objective here is to develop a classifier for failure causes where variables depend on a set of measured parameters. In the context of our work, we assume that the drift problem of a production system is generally observed in control products phase. The model proposed in this paper for failure causes classification is structured in the form of a causes-effects graph based on Hierarchical Naïve Bayes formalism (HNB). Our key contribution in this is the methodology that allows developing failure causes classification test model in the complex and uncertain manufacturing context
Safety in industrial process and production plants is a concern of rising importance, especially if ...
This paper proposes a new fault detection and diagnosis(FDD) method for the Tennessee Eastman(TE) la...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
This paper proposes a test protocol for drift identification and classification in a complex product...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
This research develops a fault diagnosis method for complex systems in the presence of uncertainties...
The complexities of process plants are increasing because of process integration and plant-wide opti...
The intensive development of information and communication technologies in recent years has led to a...
A class of functional model known as multilevel flow model (MFM) is used to represent a pilot scale ...
Safety in industrial process and production plants is a concern of rising importance, especially if ...
This paper proposes a new fault detection and diagnosis(FDD) method for the Tennessee Eastman(TE) la...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
This paper proposes a test protocol for drift identification and classification in a complex product...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audienceThis paper proposes an approach to accurately localize the origin of product q...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThis paper presents a general methodology to improve risk assessment in the sp...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
This research develops a fault diagnosis method for complex systems in the presence of uncertainties...
The complexities of process plants are increasing because of process integration and plant-wide opti...
The intensive development of information and communication technologies in recent years has led to a...
A class of functional model known as multilevel flow model (MFM) is used to represent a pilot scale ...
Safety in industrial process and production plants is a concern of rising importance, especially if ...
This paper proposes a new fault detection and diagnosis(FDD) method for the Tennessee Eastman(TE) la...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...