International audienceThis paper proposes an approach to accurately localize the origin of product quality drifts, in a flexible manufacturing system (FMS). The failure propagation mechanism in a production process is proposed based on the relationships between failure sources to explain the failure propagation following production flow. The logical diagnosis model is used to reduce the search space of suspected equipment in the production flow; however, it does not help in accurately localizing the faulty equipment. In the proposed approach, we model this reduced search space as a Bayesian network that uses historical data to compute conditional probabilities for each suspected equipment. This approach helps in making accurate decisions on...
A Bayesian network (BN) is a powerful tool to represent the quantitative and qualitative features of...
Companies nowadays act in global production networks. These networks offer advantages such as produc...
AbstractThis paper describes a new defect cause search support system by combining Bayesian network ...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
Increasing demand diversity and volume in semiconductor industry (SI) have resulted in shorter produ...
International audienceThis paper proposes a test protocol for drift identification and classificatio...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper proposes a test protocol for drift identification and classification in a complex product...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
[EN] This paper presents a modeling methodology, detection and isolation of faults on the operative ...
The diagnostic problem is posed as recognizing patterns in rejection data and thesubsequent mapping ...
A Bayesian network (BN) is a powerful tool to represent the quantitative and qualitative features of...
Companies nowadays act in global production networks. These networks offer advantages such as produc...
AbstractThis paper describes a new defect cause search support system by combining Bayesian network ...
Abstract: This paper proposes a method to accurately locate the source of product quality drift in a...
International audiencePresent manufacturing systems are equipped with sensors that provide a basis f...
International audienceThe paper proposes a diagnosis approach corresponding to the specific MES leve...
Increasing demand diversity and volume in semiconductor industry (SI) have resulted in shorter produ...
International audienceThis paper proposes a test protocol for drift identification and classificatio...
This paper provides a comprehensive data-driven diagnosis approach applicable to complex manufacturi...
International audienceThis paper provides a comprehensive data-driven diagnosis approach applicable ...
This paper proposes a test protocol for drift identification and classification in a complex product...
Semiconductor Industry (SI) is facing the challenge of short product life cycles due to increasing d...
Today root causes of failures and quality deviations in manufacturing are usually identified using e...
[EN] This paper presents a modeling methodology, detection and isolation of faults on the operative ...
The diagnostic problem is posed as recognizing patterns in rejection data and thesubsequent mapping ...
A Bayesian network (BN) is a powerful tool to represent the quantitative and qualitative features of...
Companies nowadays act in global production networks. These networks offer advantages such as produc...
AbstractThis paper describes a new defect cause search support system by combining Bayesian network ...