International audienceWe will present a technique based on Impulse Response (IR) evaluation using pseudo-random MaximumLength Sequences (MLS). We will demonstrate the use of this technique for a fast and accurate broadband determination of MEMS behaviour, in particular for the characterisation of MEMS structures such as cantilevers bridges, and membranes determining their mechanical and thermal behaviour using just electrical tests
Abstract: The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electr...
The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electro Mechanic...
This article presents a technique that enables online testing of sensors through the superposition o...
This paper presents a built-in-self-test (BIST) implementation of pseudo-random testing for MEMS. Th...
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro El...
International audienceWe present a method for a fast and accurate broadband determination of the beh...
International audienceWith the rapid development of system-on-chip (SoC) applications, containing di...
International audiencePseudorandom test techniques are widely used for measuring the impulse respons...
International audienceMicrosystems are usually affected by multiple failure sources. A faulty behavi...
International audienceMicrosystems are usually affected by multiple failure sources. A faulty behavi...
International audienceThis article presents a technique for nonlinear devices characterization and t...
International audienceIn this paper we study the use of the pseudorandom (PR) technique for test and...
This work describes the use of the MLS (Maximum Length Sequence) signal for the measurement of impul...
Abstract: The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electr...
The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electro Mechanic...
This article presents a technique that enables online testing of sensors through the superposition o...
This paper presents a built-in-self-test (BIST) implementation of pseudo-random testing for MEMS. Th...
This paper presents a Built-In-Self-Test (BIST) implementation of pseudo-random testing for Micro El...
International audienceWe present a method for a fast and accurate broadband determination of the beh...
International audienceWith the rapid development of system-on-chip (SoC) applications, containing di...
International audiencePseudorandom test techniques are widely used for measuring the impulse respons...
International audienceMicrosystems are usually affected by multiple failure sources. A faulty behavi...
International audienceMicrosystems are usually affected by multiple failure sources. A faulty behavi...
International audienceThis article presents a technique for nonlinear devices characterization and t...
International audienceIn this paper we study the use of the pseudorandom (PR) technique for test and...
This work describes the use of the MLS (Maximum Length Sequence) signal for the measurement of impul...
Abstract: The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electr...
The aim of this work is to develop a low-overhead, low-cost built-in test for Micro Electro Mechanic...
This article presents a technique that enables online testing of sensors through the superposition o...