International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arrays (FPGAs) used for space applications. However, accurate measurement of SETs in FPGAs is challenging. This paper describes a calibrated circuit for on-chip measurement of SETs with a temporal precision better than one gate delay. In addition, a technique to measure the final effect of SETs in clocked, complex circuits is presented. Heavy-ion test results for a ProASIC3L FPGA are reported, highlighting a strong dependence between the VersaTile configuration and input signal state with the SET sensitivity and pulse propagation
It is necessary for space applications to evaluate the sensitivity of electronic devices to radiatio...
The generation and propagation of single event transients (SET) in logic gate chains is studied and ...
Abstract—This paper presents two circuits to measure pulse width distribution of single event transi...
International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arr...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
Flash-based FPGAs are more and more interesting for space applications because of their robustness a...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
It is necessary for space applications to evaluate the sensitivity of electronic devices to radiatio...
The generation and propagation of single event transients (SET) in logic gate chains is studied and ...
Abstract—This paper presents two circuits to measure pulse width distribution of single event transi...
International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arr...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate ...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
Flash-based FPGAs are more and more interesting for space applications because of their robustness a...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technolo...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
It is necessary for space applications to evaluate the sensitivity of electronic devices to radiatio...
The generation and propagation of single event transients (SET) in logic gate chains is studied and ...
Abstract—This paper presents two circuits to measure pulse width distribution of single event transi...